Initial version.

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+/******************************************************************************
+*
+* Copyright (C) 2009 - 2015 Xilinx, Inc. All rights reserved.
+*
+* Permission is hereby granted, free of charge, to any person obtaining a copy
+* of this software and associated documentation files (the "Software"), to deal
+* in the Software without restriction, including without limitation the rights
+* to use, copy, modify, merge, publish, distribute, sublicense, and/or sell
+* copies of the Software, and to permit persons to whom the Software is
+* furnished to do so, subject to the following conditions:
+*
+* The above copyright notice and this permission notice shall be included in
+* all copies or substantial portions of the Software.
+*
+* THE SOFTWARE IS PROVIDED "AS IS", WITHOUT WARRANTY OF ANY KIND, EXPRESS OR
+* IMPLIED, INCLUDING BUT NOT LIMITED TO THE WARRANTIES OF MERCHANTABILITY,
+* FITNESS FOR A PARTICULAR PURPOSE AND NONINFRINGEMENT. IN NO EVENT SHALL
+* XILINX  BE LIABLE FOR ANY CLAIM, DAMAGES OR OTHER LIABILITY,
+* WHETHER IN AN ACTION OF CONTRACT, TORT OR OTHERWISE, ARISING FROM, OUT OF
+* OR IN CONNECTION WITH THE SOFTWARE OR THE USE OR OTHER DEALINGS IN THE
+* SOFTWARE.
+*
+* Except as contained in this notice, the name of the Xilinx shall not be used
+* in advertising or otherwise to promote the sale, use or other dealings in
+* this Software without prior written authorization from Xilinx.
+*
+******************************************************************************/
+/*****************************************************************************/
+/**
+*
+* @file xil_testmem.h
+* @addtogroup common_test_utils
+*
+* <h2>Memory test</h2>
+*
+* The xil_testmem.h file contains utility functions to test memory.
+* A subset of the memory tests can be selected or all of the tests can be run
+* in order. If there is an error detected by a subtest, the test stops and the
+* failure code is returned. Further tests are not run even if all of the tests
+* are selected.
+* Following list describes the supported memory tests:
+*
+*  - XIL_TESTMEM_ALLMEMTESTS: This test runs all of the subtests.
+*
+*  - XIL_TESTMEM_INCREMENT: This test
+* starts at 'XIL_TESTMEM_INIT_VALUE' and uses the incrementing value as the
+* test value for memory.
+*
+*  - XIL_TESTMEM_WALKONES: Also known as the Walking ones test. This test
+* uses a walking '1' as the test value for memory.
+* @code
+*          location 1 = 0x00000001
+*          location 2 = 0x00000002
+*          ...
+* @endcode
+*
+*  - XIL_TESTMEM_WALKZEROS: Also known as the Walking zero's test.
+* This test uses the inverse value of the walking ones test
+* as the test value for memory.
+* @code
+*       location 1 = 0xFFFFFFFE
+*       location 2 = 0xFFFFFFFD
+*       ...
+*@endcode
+*
+*  - XIL_TESTMEM_INVERSEADDR: Also known as the inverse address test.
+* This test uses the inverse of the address of the location under test
+* as the test value for memory.
+*
+*  - XIL_TESTMEM_FIXEDPATTERN: Also known as the fixed pattern test.
+* This test uses the provided patters as the test value for memory.
+* If zero is provided as the pattern the test uses '0xDEADBEEF".
+*
+* @warning
+* The tests are <b>DESTRUCTIVE</b>. Run before any initialized memory spaces
+* have been set up.
+* The address provided to the memory tests is not checked for
+* validity except for the NULL case. It is possible to provide a code-space
+* pointer for this test to start with and ultimately destroy executable code
+* causing random failures.
+*
+* @note
+* Used for spaces where the address range of the region is smaller than
+* the data width. If the memory range is greater than 2 ** width,
+* the patterns used in XIL_TESTMEM_WALKONES and XIL_TESTMEM_WALKZEROS will
+* repeat on a boundry of a power of two making it more difficult to detect
+* addressing errors. The XIL_TESTMEM_INCREMENT and XIL_TESTMEM_INVERSEADDR
+* tests suffer the same problem. Ideally, if large blocks of memory are to be
+* tested, break them up into smaller regions of memory to allow the test
+* patterns used not to repeat over the region tested.
+*
+* <pre>
+* MODIFICATION HISTORY:
+*
+* Ver    Who    Date    Changes
+* ----- ---- -------- -----------------------------------------------
+* 1.00a hbm  08/25/09 First release
+* </pre>
+*
+******************************************************************************/
+
+#ifndef XIL_TESTMEM_H	/* prevent circular inclusions */
+#define XIL_TESTMEM_H	/* by using protection macros */
+
+#ifdef __cplusplus
+extern "C" {
+#endif
+
+/***************************** Include Files *********************************/
+#include "xil_types.h"
+
+/************************** Constant Definitions *****************************/
+
+
+/**************************** Type Definitions *******************************/
+
+/* xutil_memtest defines */
+
+#define XIL_TESTMEM_INIT_VALUE	1U
+
+/** @name Memory subtests
+ * @{
+ */
+/**
+ * See the detailed description of the subtests in the file description.
+ */
+#define XIL_TESTMEM_ALLMEMTESTS     0x00U
+#define XIL_TESTMEM_INCREMENT       0x01U
+#define XIL_TESTMEM_WALKONES        0x02U
+#define XIL_TESTMEM_WALKZEROS       0x03U
+#define XIL_TESTMEM_INVERSEADDR     0x04U
+#define XIL_TESTMEM_FIXEDPATTERN    0x05U
+#define XIL_TESTMEM_MAXTEST         XIL_TESTMEM_FIXEDPATTERN
+/* @} */
+
+/***************** Macros (Inline Functions) Definitions *********************/
+
+
+/************************** Function Prototypes ******************************/
+
+/* xutil_testmem prototypes */
+
+extern s32 Xil_TestMem32(u32 *Addr, u32 Words, u32 Pattern, u8 Subtest);
+extern s32 Xil_TestMem16(u16 *Addr, u32 Words, u16 Pattern, u8 Subtest);
+extern s32 Xil_TestMem8(u8 *Addr, u32 Words, u8 Pattern, u8 Subtest);
+
+#ifdef __cplusplus
+}
+#endif
+
+#endif /* end of protection macro */
+/**
+* @} End of "addtogroup common_test_utils".
+*/