/****************************************************************************** * * Copyright (C) 2009 - 2015 Xilinx, Inc. All rights reserved. * * Permission is hereby granted, free of charge, to any person obtaining a copy * of this software and associated documentation files (the "Software"), to deal * in the Software without restriction, including without limitation the rights * to use, copy, modify, merge, publish, distribute, sublicense, and/or sell * copies of the Software, and to permit persons to whom the Software is * furnished to do so, subject to the following conditions: * * The above copyright notice and this permission notice shall be included in * all copies or substantial portions of the Software. * * THE SOFTWARE IS PROVIDED "AS IS", WITHOUT WARRANTY OF ANY KIND, EXPRESS OR * IMPLIED, INCLUDING BUT NOT LIMITED TO THE WARRANTIES OF MERCHANTABILITY, * FITNESS FOR A PARTICULAR PURPOSE AND NONINFRINGEMENT. IN NO EVENT SHALL * XILINX BE LIABLE FOR ANY CLAIM, DAMAGES OR OTHER LIABILITY, * WHETHER IN AN ACTION OF CONTRACT, TORT OR OTHERWISE, ARISING FROM, OUT OF * OR IN CONNECTION WITH THE SOFTWARE OR THE USE OR OTHER DEALINGS IN THE * SOFTWARE. * * Except as contained in this notice, the name of the Xilinx shall not be used * in advertising or otherwise to promote the sale, use or other dealings in * this Software without prior written authorization from Xilinx. * ******************************************************************************/ /*****************************************************************************/ /** * * @file xil_testmem.h * @addtogroup common_test_utils * *

Memory test

* * The xil_testmem.h file contains utility functions to test memory. * A subset of the memory tests can be selected or all of the tests can be run * in order. If there is an error detected by a subtest, the test stops and the * failure code is returned. Further tests are not run even if all of the tests * are selected. * Following list describes the supported memory tests: * * - XIL_TESTMEM_ALLMEMTESTS: This test runs all of the subtests. * * - XIL_TESTMEM_INCREMENT: This test * starts at 'XIL_TESTMEM_INIT_VALUE' and uses the incrementing value as the * test value for memory. * * - XIL_TESTMEM_WALKONES: Also known as the Walking ones test. This test * uses a walking '1' as the test value for memory. * @code * location 1 = 0x00000001 * location 2 = 0x00000002 * ... * @endcode * * - XIL_TESTMEM_WALKZEROS: Also known as the Walking zero's test. * This test uses the inverse value of the walking ones test * as the test value for memory. * @code * location 1 = 0xFFFFFFFE * location 2 = 0xFFFFFFFD * ... *@endcode * * - XIL_TESTMEM_INVERSEADDR: Also known as the inverse address test. * This test uses the inverse of the address of the location under test * as the test value for memory. * * - XIL_TESTMEM_FIXEDPATTERN: Also known as the fixed pattern test. * This test uses the provided patters as the test value for memory. * If zero is provided as the pattern the test uses '0xDEADBEEF". * * @warning * The tests are DESTRUCTIVE. Run before any initialized memory spaces * have been set up. * The address provided to the memory tests is not checked for * validity except for the NULL case. It is possible to provide a code-space * pointer for this test to start with and ultimately destroy executable code * causing random failures. * * @note * Used for spaces where the address range of the region is smaller than * the data width. If the memory range is greater than 2 ** width, * the patterns used in XIL_TESTMEM_WALKONES and XIL_TESTMEM_WALKZEROS will * repeat on a boundry of a power of two making it more difficult to detect * addressing errors. The XIL_TESTMEM_INCREMENT and XIL_TESTMEM_INVERSEADDR * tests suffer the same problem. Ideally, if large blocks of memory are to be * tested, break them up into smaller regions of memory to allow the test * patterns used not to repeat over the region tested. * *
* MODIFICATION HISTORY:
*
* Ver    Who    Date    Changes
* ----- ---- -------- -----------------------------------------------
* 1.00a hbm  08/25/09 First release
* 
* ******************************************************************************/ #ifndef XIL_TESTMEM_H /* prevent circular inclusions */ #define XIL_TESTMEM_H /* by using protection macros */ #ifdef __cplusplus extern "C" { #endif /***************************** Include Files *********************************/ #include "xil_types.h" /************************** Constant Definitions *****************************/ /**************************** Type Definitions *******************************/ /* xutil_memtest defines */ #define XIL_TESTMEM_INIT_VALUE 1U /** @name Memory subtests * @{ */ /** * See the detailed description of the subtests in the file description. */ #define XIL_TESTMEM_ALLMEMTESTS 0x00U #define XIL_TESTMEM_INCREMENT 0x01U #define XIL_TESTMEM_WALKONES 0x02U #define XIL_TESTMEM_WALKZEROS 0x03U #define XIL_TESTMEM_INVERSEADDR 0x04U #define XIL_TESTMEM_FIXEDPATTERN 0x05U #define XIL_TESTMEM_MAXTEST XIL_TESTMEM_FIXEDPATTERN /* @} */ /***************** Macros (Inline Functions) Definitions *********************/ /************************** Function Prototypes ******************************/ /* xutil_testmem prototypes */ extern s32 Xil_TestMem32(u32 *Addr, u32 Words, u32 Pattern, u8 Subtest); extern s32 Xil_TestMem16(u16 *Addr, u32 Words, u16 Pattern, u8 Subtest); extern s32 Xil_TestMem8(u8 *Addr, u32 Words, u8 Pattern, u8 Subtest); #ifdef __cplusplus } #endif #endif /* end of protection macro */ /** * @} End of "addtogroup common_test_utils". */